ORNL software engineer Eric Lingerfelt (right) and Stephen Jesse (left) of ORNL’s Center for Nanophase Materials Sciences led the development of the Bellerophon Environment for Analysis of Materials (BEAM), an ORNL platform that combines the lab’s state-of-the art imaging technologies with advanced data analytics and high-performance computing to accelerate materials science research.
Using today’s advanced microscopes, scientists are able to capture exponentially more information about the materials they study compared to a decade ago—in greater detail and in less time. While these new capabilities are a boon for researchers, helping to answer key questions that could lead to next-generation technologies, they also present a new problem: How to make effective use of all this data?
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An Accelerated Pipeline to Open Materials Research